ENTRY T0251 20040617 0000T025100000001 SUBENT T0251001 20040617 0000T025100100001 BIB 9 15 T025100100002 INSTITUTE (1USAMIN) T025100100003 REFERENCE (J,PRL,34,1527,1975) T025100100004 AUTHOR (H.P.Morsch,D.Dehnhard,T.K.Li) T025100100005 TITLE Strong Polarization of the 1p-Shell Core in the Lowest T025100100006 0+ States of 24Mg and 28Si T025100100007 FACILITY (VDGT,1USAMIN) T025100100008 DETECTOR (MAGSP,PSSSD) Scattering alpha particles detected usingT025100100009 position-sensitive solid-state detectors placed along T025100100010 focal plane of an Enge splin-pole magnetic T025100100011 spectrometer. T025100100012 ERR-ANALYS (DATA-ERR) Absolute error T025100100013 (ANG-ERR-D) Digitizing error in angle. T025100100014 (ERR-DIG) Digitizing error in data. T025100100015 STATUS (CURVE) Scanned from Fig.1 of article by RFNC-VNIIEF. T025100100016 HISTORY (20040405C) T025100100017 ENDBIB 15 0 T025100100018 COMMON 4 3 T025100100019 EN DATA-ERR ANG-ERR-D ERR-DIG T025100100020 MEV PER-CENT ADEG PER-CENT T025100100021 23.5 15.0 0.3 0.2 T025100100022 ENDCOMMON 3 0 T025100100023 ENDSUBENT 22 0 T025100199999 SUBENT T0251002 20040512 0000T025100200001 BIB 2 3 T025100200002 REACTION (12-MG-24(A,INL)12-MG-24,PAR,DA) T025100200003 SAMPLE Enriched 24Mg targets, approximately 50 microg/cm2 T025100200004 thick. T025100200005 ENDBIB 3 0 T025100200006 COMMON 1 3 T025100200007 E-LVL T025100200008 MEV T025100200009 6.43 T025100200010 ENDCOMMON 3 0 T025100200011 DATA 2 17 T025100200012 ANG-CM DATA-CM T025100200013 ADEG MB/SR T025100200014 7.5 2.1422E+00 T025100200015 9.1 1.3060E+00 T025100200016 9.8 6.7877E-01 T025100200017 11.2 2.7817E-01 T025100200018 13.5 6.2895E-02 T025100200019 17.8 7.5512E-01 T025100200020 20.1 1.1712E+00 T025100200021 22.5 1.0628E+00 T025100200022 27.5 5.6558E-02 T025100200023 29.4 2.5607E-02 T025100200024 32.0 1.2564E-01 T025100200025 33.8 3.3291E-01 T025100200026 36.1 6.6835E-01 T025100200027 41.3 7.4161E-01 T025100200028 45.7 3.4331E-01 T025100200029 54.2 9.7124E-02 T025100200030 56.6 1.3110E-01 T025100200031 ENDDATA 19 0 T025100200032 ENDSUBENT 31 0 T025100299999 SUBENT T0251003 20040512 0000T025100300001 BIB 2 3 T025100300002 REACTION (14-SI-28(A,INL)14-SI-28,PAR,DA) T025100300003 SAMPLE SiO2 targets enriched in 28Si; approximately 50 T025100300004 microg/cm2 thick. T025100300005 ENDBIB 3 0 T025100300006 COMMON 1 3 T025100300007 E-LVL T025100300008 MEV T025100300009 4.98 T025100300010 ENDCOMMON 3 0 T025100300011 DATA 2 32 T025100300012 ANG-CM DATA-CM T025100300013 ADEG MB/SR T025100300014 7.9 2.7198E+00 T025100300015 9.0 1.4024E+00 T025100300016 11.5 9.3134E-02 T025100300017 15.9 1.2518E+00 T025100300018 17.0 1.5633E+00 T025100300019 18.3 1.8385E+00 T025100300020 19.3 2.0765E+00 T025100300021 20.6 2.0378E+00 T025100300022 25.0 8.7975E-01 T025100300023 27.3 2.3866E-01 T025100300024 29.9 3.3355E-02 T025100300025 32.1 1.5103E-01 T025100300026 34.2 4.6661E-01 T025100300027 36.5 6.9923E-01 T025100300028 38.6 6.5975E-01 T025100300029 40.8 4.8906E-01 T025100300030 43.0 3.0252E-01 T025100300031 45.4 5.7150E-02 T025100300032 48.1 2.9514E-02 T025100300033 52.3 3.7339E-01 T025100300034 54.4 5.8237E-01 T025100300035 56.9 7.7370E-01 T025100300036 59.1 7.3001E-01 T025100300037 63.3 5.0031E-01 T025100300038 65.7 2.3836E-01 T025100300039 67.8 9.6645E-02 T025100300040 72.1 8.5213E-03 T025100300041 74.4 8.9785E-02 T025100300042 76.3 2.1789E-01 T025100300043 78.2 2.7788E-01 T025100300044 80.1 3.2051E-01 T025100300045 84.7 2.2877E-01 T025100300046 ENDDATA 34 0 T025100300047 ENDSUBENT 46 0 T025100399999 ENDENTRY 3 0 T025199999999