ENTRY O2446 20221224 O244600000001 SUBENT O2446001 20221224 20230412 O244600100001 BIB 8 19 O244600100002 TITLE Cross section measurements of proton capture O244600100003 reactions on Se isotopes relevant to the O244600100004 astrophysical p process O244600100005 AUTHOR (V.Foteinou,S.Harissopulos,M.Axiotis,A.Lagoyannis, O244600100006 G.Provatas, A.Spyrou,G.Perdikakis,Ch.Zarkadas, O244600100007 P.Demetriou) O244600100008 INSTITUTE (2GRCATH,3ZZZIAE) O244600100009 REFERENCE (J,PR/C,97,035806,2018) O244600100010 #doi:10.1103/PhysRevC.97.035806 O244600100011 (J,NP/A,719,C115,2003) prelim. data of 80Se(p,gamma) O244600100012 METHOD (BCINT) O244600100013 INC-SPECT The corresponding effective beam energies in the O244600100014 center-of-mass system is deduced from the incident O244600100015 proton beam energy and its energy loss at the center ofO244600100016 the target. O244600100017 CORRECTION Electron screening correction applied. O244600100018 HISTORY (20190514C) VS O244600100019 (20191226U) SD: Ref. NP/A,719,C115,2003 added. O244600100020 (20221224A) SD: Correction in Subent 002. O244600100021 ENDBIB 19 0 O244600100022 NOCOMMON 0 0 O244600100023 ENDSUBENT 22 0 O244600199999 SUBENT O2446002 20221224 20230412 O244600200001 BIB 8 21 O244600200002 REACTION 1(34-SE-78(P,G)35-BR-79,,SIG) O244600200003 2(34-SE-78(P,G)35-BR-79,,SIG,,SFC) O244600200004 FACILITY (DYNAM,2GERTHS) 4-MV single-ended Dynamitron. O244600200005 DETECTOR (HPGE) Four hyper-pure Ge(HPGe) detectors. The relativeO244600200006 efficiency was almost 100 % for the three of them and O244600200007 76% for the fourth one. The Compton background O244600200008 suppressed by using four BGO crystals surrounding the O244600200009 Ge detectors. O244600200010 SAMPLE The effective areal density 90 +- 9 ug/cm2 O244600200011 (34-SE-78,ENR=0.978) O244600200012 ANALYSIS (INTAD) Gamma-singles spectra measured at eight O244600200013 angles with respect to the beam direction. O244600200014 ERR-ANALYS (ERR-T) Total uncertainty calculated from the error O244600200015 propagation of: O244600200016 (ERR-1) thickness of the target - 10% O244600200017 (ERR-2) detector efficiency - 5% O244600200018 (ERR-3) accumulated charge - 3% O244600200019 (ERR-4,3.,30.) total angle-integrated yield. O244600200020 STATUS (TABLE) Table II of Phys.Rev.C97(2018)035806 O244600200021 HISTORY (20221224A) SD: Col.title in 5th field corrected O244600200022 (DATA -> ERR-T). O244600200023 ENDBIB 21 0 O244600200024 COMMON 3 3 O244600200025 ERR-1 ERR-2 ERR-3 O244600200026 PER-CENT PER-CENT PER-CENT O244600200027 10. 5. 3. O244600200028 ENDCOMMON 3 0 O244600200029 DATA 5 12 O244600200030 EN-CM DATA 1ERR-T 1DATA 2ERR-T 2 O244600200031 MEV MICRO-B MICRO-B B*MEV B*MEV O244600200032 1.681 30.9 3.6 9.04E+06 1.05E+06 O244600200033 1.879 120. 13. 9.68E+06 1.01E+06 O244600200034 1.978 170. 18. 7.75E+06 0.84E+06 O244600200035 2.177 415. 43. 6.82E+06 0.71E+06 O244600200036 2.276 619. 65. 6.44E+06 0.67E+06 O244600200037 2.376 920. 96. 6.25E+06 0.65E+06 O244600200038 2.475 1141. 119. 5.19E+06 0.54E+06 O244600200039 2.574 1683. 175. 5.25E+06 0.55E+06 O244600200040 2.673 2309. 240. 5.06E+06 0.53E+06 O244600200041 2.773 3026. 315. 4.74E+06 0.49E+06 O244600200042 2.872 4018. 421. 4.59E+06 0.48E+06 O244600200043 2.969 4614. 485. 3.94E+06 0.41E+06 O244600200044 ENDDATA 14 0 O244600200045 ENDSUBENT 44 0 O244600299999 SUBENT O2446003 20190514 O070O244600300001 BIB 9 22 O244600300002 REACTION 1(34-SE-80(P,G)35-BR-81,,SIG) O244600300003 2(34-SE-80(P,G)35-BR-81,,SIG,,SFC) O244600300004 FACILITY (DYNAM,2GERTHS) 4-MV single-ended Dynamitron. O244600300005 DETECTOR (HPGE) Four hyper-pure Ge(HPGe) detectors. The relativeO244600300006 efficiency was almost 100 % for the three of them and O244600300007 76% for the fourth one. The Compton background O244600300008 suppressed by using four BGO crystals surrounding the O244600300009 Ge detectors. O244600300010 SAMPLE Two samples with areal densities of 106 +- 11 and O244600300011 132 +-13 ug/cm2. O244600300012 (34-SE-80,ENR=0.978) O244600300013 PART-DET (G) O244600300014 METHOD (BCINT) O244600300015 ANALYSIS (INTAD) Gamma-singles spectra measured at eight O244600300016 angles with respect to the beam direction. O244600300017 ERR-ANALYS (ERR-T) Total uncertainty calculated from the error O244600300018 propagation of: O244600300019 (ERR-1) thickness of the target - 10% O244600300020 (ERR-2) detector efficiency - 5% O244600300021 (ERR-3) accumulated charge - 3% O244600300022 (ERR-4,3.,30.) total angle-integrated yield. O244600300023 STATUS (TABLE) Table II of Phys.Rev.C97(2018)035806 O244600300024 ENDBIB 22 0 O244600300025 COMMON 3 3 O244600300026 ERR-1 ERR-2 ERR-3 O244600300027 PER-CENT PER-CENT PER-CENT O244600300028 10. 5. 3. O244600300029 ENDCOMMON 3 0 O244600300030 DATA 5 18 O244600300031 EN-CM DATA 1ERR-T 1DATA 2ERR-T 2 O244600300032 MEV MICRO-B MICRO-B B*MEV B*MEV O244600300033 1.482 8.53 1.03 1.19E+07 1.4E+06 O244600300034 1.681 37.4 4.0 1.10E+07 1.2E+06 O244600300035 1.782 75.0 8.2 1.11E+07 1.2E+06 O244600300036 1.880 133. 15. 1.07E+07 1.2E+06 O244600300037 1.981 242. 26. 1.09E+07 1.2E+06 O244600300038 2.078 389. 43. 1.04E+07 1.1E+06 O244600300039 2.180 611. 66. 9.94E+06 1.07E+06 O244600300040 2.277 881. 97. 9.16E+06 1.00E+06 O244600300041 2.379 1229. 137. 8.26E+06 9.2E+05 O244600300042 2.476 1726. 191. 7.84E+06 8.7E+05 O244600300043 2.577 2148. 237. 6.65E+06 7.3E+05 O244600300044 2.627 3006. 329. 7.77E+06 8.5E+05 O244600300045 2.677 2285. 254. 4.96E+06 5.5E+05 O244600300046 2.777 1492. 177. 2.32E+06 2.7E+05 O244600300047 2.876 1335. 156. 1.51E+06 1.8E+05 O244600300048 3.076 698. 95. 4.40E+05 6.0E+04 O244600300049 3.274 624. 96. 2.32E+05 3.6E+04 O244600300050 3.473 777. 112. 1.79E+05 2.6E+04 O244600300051 ENDDATA 20 0 O244600300052 ENDSUBENT 51 0 O244600399999 SUBENT O2446004 20190514 O070O244600400001 BIB 8 20 O244600400002 REACTION 1(34-SE-74(P,G)35-BR-75,,SIG) O244600400003 2(34-SE-74(P,G)35-BR-75,,SIG,,SFC) O244600400004 FACILITY (VDGT,2GRCATH) 5.5-MV T11/25 Van de Graaff Tandem O244600400005 Accelerator Laboratory of NCSR "Demokritos" O244600400006 DETECTOR (HPGE) Sample-to-detector distance 15 cm. O244600400007 METHOD (ACTIV) Irradiation time: 4 h. O244600400008 End of irr. - start of measurement time: 6 to 15 min. O244600400009 (GSPEC) O244600400010 DECAY-DATA (35-BR-75,96.7MIN,DG,286.5,0.88) O244600400011 SAMPLE natSe samples with diameter of 20 mm and thickness of O244600400012 0.3 mm produced by evaporating metallic Se onto Al or O244600400013 Si wafers. O244600400014 ERR-ANALYS (ERR-T) Total uncertainty calculated from the error O244600400015 propagation of: O244600400016 (ERR-1) thickness of the target - 5% O244600400017 (ERR-2) detector efficiency - 3% O244600400018 (ERR-3) total beam charge - 3% O244600400019 (ERR-4,1.,12.) intensity of the gamma-transitions O244600400020 - statistical uncertainties. O244600400021 STATUS (TABLE) Table IV of Phys.Rev.C97(2018)035806 O244600400022 ENDBIB 20 0 O244600400023 COMMON 3 3 O244600400024 ERR-1 ERR-2 ERR-3 O244600400025 PER-CENT PER-CENT PER-CENT O244600400026 5. 3. 3. O244600400027 ENDCOMMON 3 0 O244600400028 DATA 5 9 O244600400029 EN-CM DATA 1ERR-T 1DATA 2ERR-T 2 O244600400030 MEV MICRO-B MICRO-B B*MEV B*MEV O244600400031 1.952 85.3 9.8 4.46E+06 5.1E+05 O244600400032 2.451 463. 51. 2.29E+06 2.5E+05 O244600400033 2.945 1203. 131. 1.05E+06 1.1E+05 O244600400034 3.438 2209. 240. 5.46E+05 5.9E+04 O244600400035 3.933 3804. 411. 3.32E+05 3.6E+04 O244600400036 4.426 4276. 468. 1.59E+05 1.7E+04 O244600400037 4.922 6585. 719. 1.19E+05 1.3E+04 O244600400038 5.416 7980. 870. 7.78E+04 0.86E+04 O244600400039 5.911 9042. 1009. 5.20E+04 0.58E+04 O244600400040 ENDDATA 11 0 O244600400041 ENDSUBENT 40 0 O244600499999 SUBENT O2446005 20190514 O070O244600500001 BIB 8 21 O244600500002 REACTION 1(34-SE-80(P,N)35-BR-80,,SIG) O244600500003 2(34-SE-80(P,N)35-BR-80,,SIG,,SFC) O244600500004 FACILITY (VDGT,2GRCATH) 5.5-MV T11/25 Van de Graaff Tandem O244600500005 Accelerator Laboratory of NCSR "Demokritos" O244600500006 DETECTOR (HPGE) Sample-to-detector distance 15 cm. O244600500007 METHOD (ACTIV) Irradiation time: 4 h. O244600500008 End of irr. - start of measurement time: 6 to 15 min. O244600500009 (GSPEC) O244600500010 DECAY-DATA (35-BR-80-G,17.68MIN,DG,665.8,0.0108, O244600500011 DG,616.3,0.067) O244600500012 SAMPLE natSe samples with diameter of 20 mm and thickness of O244600500013 0.3 mm produced by evaporating metallic Se onto Al or O244600500014 Si wafers. O244600500015 ERR-ANALYS (ERR-T) Total uncertainty calculated from the error O244600500016 propagation of: O244600500017 (ERR-1) thickness of the target - 5% O244600500018 (ERR-2) detector efficiency - 3% O244600500019 (ERR-3) total beam charge - 3% O244600500020 (ERR-4,1.,12.) intensity of the gamma-transitions O244600500021 - statistical uncertainties. O244600500022 STATUS (TABLE) Table IV of Phys.Rev.C97(2018)035806 O244600500023 ENDBIB 21 0 O244600500024 COMMON 3 3 O244600500025 ERR-1 ERR-2 ERR-3 O244600500026 PER-CENT PER-CENT PER-CENT O244600500027 5. 3. 3. O244600500028 ENDCOMMON 3 0 O244600500029 DATA 5 7 O244600500030 EN-CM DATA 1ERR-T 1DATA 2ERR-T 2 O244600500031 MEV MB MB B*MEV B*MEV O244600500032 2.948 5.06 0.75 4.61E+06 6.6E+05 O244600500033 3.442 18.8 2.2 4.66E+06 5.3E+05 O244600500034 3.937 51.5 5.9 4.50E+06 5.1E+05 O244600500035 4.430 71.3 8.2 2.66E+06 3.0E+05 O244600500036 4.927 252. 29. 4.58E+06 5.1E+05 O244600500037 5.421 398. 45. 3.93E+06 4.4E+05 O244600500038 5.917 266. 30. 1.54E+06 1.7E+05 O244600500039 ENDDATA 9 0 O244600500040 ENDSUBENT 39 0 O244600599999 SUBENT O2446006 20190514 O070O244600600001 BIB 8 27 O244600600002 REACTION 1(34-SE-82(P,N)35-BR-82,,SIG) O244600600003 2(34-SE-82(P,N)35-BR-82,,SIG,,SFC) O244600600004 FACILITY (VDGT,2GRCATH) 5.5-MV T11/25 Van de Graaff Tandem O244600600005 Accelerator Laboratory of NCSR "Demokritos" O244600600006 DETECTOR (HPGE) Sample-to-detector distance 15 cm. O244600600007 METHOD (ACTIV) Irradiation time: 4 h. O244600600008 End of irr. - start of measurement time: 6 to 15 min. O244600600009 (GSPEC) O244600600010 DECAY-DATA (35-BR-82-G,35.282HR,DG,554.3,0.711, O244600600011 DG,619.1,0.435, O244600600012 DG,698.4,0.283, O244600600013 DG,776.5,0.834, O244600600014 DG,827.8,0.240, O244600600015 DG,1044.0,0.283, O244600600016 DG,1317.5,0.268, O244600600017 DG,1474.9,0.1660) O244600600018 SAMPLE natSe samples with diameter of 20 mm and thickness of O244600600019 0.3 mm produced by evaporating metallic Se onto Al or O244600600020 Si wafers. O244600600021 ERR-ANALYS (ERR-T) Total uncertainty calculated from the error O244600600022 propagation of: O244600600023 (ERR-1) thickness of the target - 5% O244600600024 (ERR-2) detector efficiency - 3% O244600600025 (ERR-3) total beam charge - 3% O244600600026 (ERR-4,1.,12.) intensity of the gamma-transitions O244600600027 - statistical uncertainties. O244600600028 STATUS (TABLE) Table IV of Phys.Rev.C97(2018)035806 O244600600029 ENDBIB 27 0 O244600600030 COMMON 3 3 O244600600031 ERR-1 ERR-2 ERR-3 O244600600032 PER-CENT PER-CENT PER-CENT O244600600033 5. 3. 3. O244600600034 ENDCOMMON 3 0 O244600600035 DATA 5 9 O244600600036 EN-CM DATA 1ERR-T 1DATA 2ERR-T 2 O244600600037 MEV MB MB B*MEV B*MEV O244600600038 1.954 0.147 0.014 7.69E+06 7.3E+05 O244600600039 2.455 1.21 0.11 5.98E+06 5.5E+05 O244600600040 2.949 5.28 0.48 4.81E+06 4.4E+05 O244600600041 3.443 16.1 1.5 3.99E+06 3.6E+05 O244600600042 3.939 41.2 3.8 3.60E+06 3.3E+05 O244600600043 4.431 67.1 6.1 2.51E+06 2.3E+05 O244600600044 4.929 147. 13. 2.67E+06 2.4E+05 O244600600045 5.423 204. 19. 2.01E+06 1.8E+05 O244600600046 5.919 306. 28. 1.78E+06 1.6E+05 O244600600047 ENDDATA 11 0 O244600600048 ENDSUBENT 47 0 O244600699999 SUBENT O2446007 20190514 O070O244600700001 BIB 8 25 O244600700002 REACTION (34-SE-0(P,X)35-BR-77,,SIG) O244600700003 Sotirios Charisopoulos (2019-10-07): The text in the O244600700004 8th page of the article "the weighted sum of the total O244600700005 cross sections of the 76Se(p,g)77Br and 77Se(p,n)77Br" O244600700006 explains the derivation of the cross section from TALYSO244600700007 (not from experiment). O244600700008 FACILITY (VDGT,2GRCATH) 5.5-MV T11/25 Van de Graaff Tandem O244600700009 Accelerator Laboratory of NCSR "Demokritos" O244600700010 DETECTOR (HPGE) Sample-to-detector distance 15 cm. O244600700011 METHOD (ACTIV) Irradiation time: 4 h. O244600700012 End of irr. - start of measurement time: 6 to 15 min. O244600700013 (GSPEC) O244600700014 DECAY-DATA (35-BR-77-G,57.04HR,DG,239.0,0.231, O244600700015 DG,520.7,0.224) O244600700016 SAMPLE natSe samples with diameter of 20 mm and thickness of O244600700017 0.3 mm produced by evaporating metallic Se onto Al or O244600700018 Si wafers. O244600700019 ERR-ANALYS (ERR-T) Total uncertainty calculated from the error O244600700020 propagation of: O244600700021 (ERR-1) thickness of the target - 5% O244600700022 (ERR-2) detector efficiency - 3% O244600700023 (ERR-3) total beam charge - 3% O244600700024 (ERR-4,1.,12.) intensity of the gamma-transitions O244600700025 - statistical uncertainties. O244600700026 STATUS (TABLE) Table IV of Phys.Rev.C97(2018)035806 O244600700027 ENDBIB 25 0 O244600700028 COMMON 3 3 O244600700029 ERR-1 ERR-2 ERR-3 O244600700030 PER-CENT PER-CENT PER-CENT O244600700031 5. 3. 3. O244600700032 ENDCOMMON 3 0 O244600700033 DATA 3 9 O244600700034 EN DATA ERR-T O244600700035 MEV MB MB O244600700036 1.978 0.168 0.020 O244600700037 2.485 0.898 0.086 O244600700038 2.985 3.15 0.30 O244600700039 3.485 9.57 0.90 O244600700040 3.987 24.6 2.3 O244600700041 4.486 32.1 3.0 O244600700042 4.989 59.3 5.6 O244600700043 5.490 86.7 8.1 O244600700044 5.991 108. 10. O244600700045 ENDDATA 11 0 O244600700046 ENDSUBENT 45 0 O244600799999 SUBENT O2446008 20190514 O070O244600800001 BIB 7 14 O244600800002 REACTION (34-SE-78(P,G)35-BR-79-M/T,,SIG/RAT) O244600800003 FACILITY (DYNAM,2GERTHS) 4-MV single-ended Dynamitron. O244600800004 DETECTOR (HPGE) Four hyper-pure Ge(HPGe) detectors. The relativeO244600800005 efficiency was almost 100 % for the three of them and O244600800006 76% for the fourth one. The Compton background O244600800007 suppressed by using four BGO crystals surrounding the O244600800008 Ge detectors. O244600800009 SAMPLE The effective areal density 90 +- 9 ug/cm2 O244600800010 (34-SE-78,ENR=0.978) O244600800011 DECAY-DATA (35-BR-79-M,4.86SEC,DG,207.6) O244600800012 ERR-ANALYS (DATA-ERR) No information on sources of uncertainties. O244600800013 STATUS (UNOBT) Request for numerical datasent on 22 May 2019 O244600800014 to corresponding author O244600800015 (CURVE) Fig. 15 (a) of Phys.Rev.C97(2018)035806 O244600800016 ENDBIB 14 0 O244600800017 NOCOMMON 0 0 O244600800018 DATA 3 7 O244600800019 EN-CM DATA DATA-ERR O244600800020 MEV NO-DIM NO-DIM O244600800021 2.4 0.069 0.009 O244600800022 2.5 0.071 0.009 O244600800023 2.6 0.064 0.008 O244600800024 2.7 0.068 0.007 O244600800025 2.8 0.068 0.008 O244600800026 2.9 0.070 0.007 O244600800027 3.0 0.085 0.010 O244600800028 ENDDATA 9 0 O244600800029 ENDSUBENT 28 0 O244600899999 SUBENT O2446009 20190514 O070O244600900001 BIB 7 15 O244600900002 REACTION (34-SE-80(P,G)35-BR-81-L/T,,SIG/RAT) O244600900003 FACILITY (DYNAM,2GERTHS) 4-MV single-ended Dynamitron. O244600900004 DETECTOR (HPGE) Four hyper-pure Ge(HPGe) detectors. The relativeO244600900005 efficiency was almost 100 % for the three of them and O244600900006 76% for the fourth one. The Compton background O244600900007 suppressed by using four BGO crystals surrounding the O244600900008 Ge detectors. O244600900009 SAMPLE natSe samples with diameter of 20 mm and thickness of O244600900010 0.3 mm produced by evaporating metallic Se onto Al or O244600900011 Si wafers. O244600900012 DECAY-DATA (35-BR-81-L,34.66MICROSEC,DG,260.2) O244600900013 ERR-ANALYS (DATA-ERR) No information on sources of uncertainties. O244600900014 STATUS (UNOBT) Request for numerical datasent on 22 May 2019 O244600900015 to corresponding author O244600900016 (CURVE) Fig. 15 (b) of Phys.Rev.C97(2018)035806 O244600900017 ENDBIB 15 0 O244600900018 NOCOMMON 0 0 O244600900019 DATA 3 16 O244600900020 EN-CM DATA DATA-ERR O244600900021 MEV NO-DIM NO-DIM O244600900022 1.7 0.039 0.006 O244600900023 1.8 0.026 0.003 O244600900024 1.9 0.036 0.004 O244600900025 1.9 0.029 0.003 O244600900026 2.0 0.029 0.004 O244600900027 2.1 0.030 0.003 O244600900028 2.2 0.027 0.003 O244600900029 2.3 0.037 0.005 O244600900030 2.3 0.038 0.004 O244600900031 2.4 0.035 0.004 O244600900032 2.5 0.032 0.003 O244600900033 2.5 0.040 0.005 O244600900034 2.6 0.039 0.005 O244600900035 2.7 0.045 0.005 O244600900036 2.8 0.043 0.006 O244600900037 3.0 0.038 0.006 O244600900038 ENDDATA 18 0 O244600900039 ENDSUBENT 38 0 O244600999999 ENDENTRY 9 0 O244699999999