ENTRY O1379 20220202 O088O137900000001 SUBENT O1379001 20220202 O088O137900100001 BIB 11 87 O137900100002 TITLE Electron screening in d(d,p)t for deuterated metals: O137900100003 temperature effects. O137900100004 REFERENCE (J,JP/G,31,1141,2005) O137900100005 (J,EPJ/A,27,(S1),79,2006) same result. O137900100006 (T,RAIOLA,2005) Ruhr university. O137900100007 AUTHOR (F.Raiola, B.Burchard, Z.Fuelop, G.Gyurky, S.Zeng, O137900100008 J.Cruz, A.Di Leva, B.Limata, M.Fonseca, H.Luis, O137900100009 M.Aliotta, H.W.Becker, C.Broggini, A.D'Onofrio, O137900100010 L.Gialanella, G.Imbriani, A.P.Jesus, M.Junker, O137900100011 J.P.Ribeiro, V.Roca, C.Rolfs, M.Romano, E.Somorjai, O137900100012 F.Strieder, F.Terrasi) O137900100013 INSTITUTE (2GERBOC,3HUNDEB,3CPRAEP,2PRTLIS,2ITYNAP,2UK EDG, O137900100014 2ITYPAD,2ITYFSN,2ITYLGS) O137900100015 FACILITY (ACCEL,2GERBOC) 100-kV accelerator. O137900100016 SAMPLE Target holder consists of a diamond plate coated with aO137900100017 metallic layer (area = 20X20 mm2, thickness t=1 mm) O137900100018 and heated by current flow. A given metal sheet (a = O137900100019 15X17 mm2) is placed on top of the diamond plate with O137900100020 interim plates (from bottom to top) of MACOR (t = 1 O137900100021 mm), Cu (t = 3 mm) and MACOR (t=1 mm). At the centre O137900100022 of the top MACOR plate there is a hole of = 5 mm O137900100023 diameter, filled with another diamond of cylindrical O137900100024 shape and 2 mm height: it provides the thermal contact O137900100025 to the metal foil. The metal foil is electrically O137900100026 insulated for current measurement. Thermal elements O137900100027 measure the temperature at the diamond plate and the O137900100028 metal foil (near the area of the ion beam spot). For O137900100029 example, for t=340 centigrade the diamond plate had to O137900100030 have a temperature of 750 centigrade, which was the O137900100031 maximum for the present set-up; above these O137900100032 temperatures, the insulators started to lose their O137900100033 electrical insulations more and more. O137900100034 In the first step, the surface of a given sample was O137900100035 cleaned "in situ" by Kr sputtering at 35 keV removing O137900100036 typically about 300 monolayers. O137900100037 COMMENT -By authors. Summary of results. See Rel-Ref O137900100038 description: temperature (temp) in centigrade. O137900100039 Ue - screening potential energy (eV). O137900100040 N/Eff - a number of valence electrons per metallic atomO137900100041 material Temp Ue solubility N/Eff O137900100042 Pt 20 675+/-70 0.06 O137900100043 100 530+/-40 0.06 O137900100044 200 530+/-40 0.05 O137900100045 300 465+/-38 0.04 O137900100046 340 480+/-70 0.04 O137900100047 Co 20 640+/-70 0.14 O137900100048 200 480+/-60 0.02 O137900100049 Ti -10 <30 2.1 O137900100050 50 <50 1.1 O137900100051 100 250+/-40 0.26 O137900100052 150 295+/-40 0.23 O137900100053 200 290+/-65 0.20 1.7+/-0.7 O137900100054 Sc 200 320+/-50 0.11 2.6+/-0.8O137900100055 Y 200 270+/-75 0.09 2.6+/-1.4O137900100056 Zr 200 205+/-70 0.13 1.1+/-0.7O137900100057 Lu 200 265+/-70 0.08 2.2+/-1.2O137900100058 Hf 200 370+/-70 0.04 4.0+/-1.5O137900100059 La 200 245+/-70 0.09 2.4+/-1.4O137900100060 Ce 200 200+/-50 0.11 1.5+/-0.7O137900100061 Nd 200 190+/-50 0.08 1.4+/-0.7O137900100062 Sm 200 314+/-60 0.08 3.5+/-1.3O137900100063 Eu 200 120+/-60 0.05 0.8+/-0.8O137900100064 Gd 200 340+/-85 0.08 4.2+/-2.1O137900100065 Tb 200 340+/-80 0.18 3.9+/-1.8O137900100066 Dy 200 340+/-70 0.09 4.9+/-2.0O137900100067 Ho 200 165+/-50 0.07 0.9+/-0.5O137900100068 Er 200 360+/-80 0.05 4.3+/-1.9O137900100069 Tm 200 260+/-80 0.05 2.2+/-1.4O137900100070 Yb 200 110+/-40 0.13 0.4+/-0.3O137900100071 C 200 <50 0.15 O137900100072 -by authors. The absolute beam energy uncertainty O137900100073 leads to a negligible uncertainty in the d(d,p)t cross O137900100074 section (e.g. 0.7% at ed = 4 keV). O137900100075 DETECTOR (SIBAR) The Si detectors were cooled to 0 centigrade. O137900100076 METHOD (EXTB,SITA,BCINT) O137900100077 The beam current on target was kept below 2 muA leadingO137900100078 to a negligible influence on the target temperature O137900100079 (less than 2 centigrade variation). O137900100080 STATUS (CURVE) Figs 1,4 from J.Phys.,G31(2005)1141 O137900100081 HISTORY (20060418C) CAJaD O137900100082 (20060602A) Reaction lines are corrected. O137900100083 (20070404A) Reference are corrected O137900100084 (20090828A) Correction in author' list has been done, O137900100085 according V.Zerkin remarks. O137900100086 (20191208U) SD: Ref. EPJ/AS,27,(S01),79,2006 added. O137900100087 (20220202U) SD: Ref. EPJ/AS,27,(S01),79 O137900100088 -> EPJ/A,27,(S1),79 O137900100089 ENDBIB 87 0 O137900100090 NOCOMMON 0 0 O137900100091 ENDSUBENT 90 0 O137900199999 SUBENT O1379002 20060602 O026O137900200001 BIB 2 2 O137900200002 REACTION (1-H-2(D,P)1-H-3,,SIG/TMP,,SFC) O137900200003 MISC-COL (MISC) The solubility of hydrogen in Pt. O137900200004 ENDBIB 2 0 O137900200005 COMMON 2 3 O137900200006 EN-ERR EN-ERR-DIG O137900200007 PER-CENT PER-CENT O137900200008 0.03 1.2 O137900200009 ENDCOMMON 3 0 O137900200010 DATA 5 40 O137900200011 EN-CM TEMP DATA DATA-ERR MISC O137900200012 KEV DEG-C B*KEV B*KEV NO-DIM O137900200013 3.87 300. 90. 5. 0.05 O137900200014 4.14 20. 135. 12. 0.04 O137900200015 4.36 20. 121. 10. O137900200016 4.63 20. 101. 10. O137900200017 4.73 300. 79. 4. O137900200018 4.86 20. 116. 11. O137900200019 5.3 20. 92. 6. O137900200020 5.49 300. 72. 5. O137900200021 5.76 20. 87. 9. O137900200022 6.26 20. 77. 8. O137900200023 6.27 300. 68.2 3.6 O137900200024 6.74 20. 77. 8. O137900200025 7.22 300. 68. 3. O137900200026 7.32 20. 78. 8. O137900200027 7.7 20. 76. 6. O137900200028 7.97 300. 64.5 2.8 O137900200029 8.22 20. 76. 9. O137900200030 8.8 20. 67. 5. O137900200031 8.81 300. 61. 2.3 O137900200032 9.3 20. 81. 11. O137900200033 9.64 300. 62.1 3. O137900200034 9.7 20. 75. 5. O137900200035 10.57 300. 56.5 1.6 O137900200036 10.81 20. 73. 7. O137900200037 11.29 300. 58.6 2.1 O137900200038 11.83 20. 76. 6. O137900200039 11.96 300. 58.6 2.1 O137900200040 12.16 300. 56.9 2. O137900200041 12.26 20. 59. 9. O137900200042 12.88 20. 57. 6. O137900200043 13.1 300. 55.5 1.8 O137900200044 13.19 20. 67. 7. O137900200045 13.99 300. 55.5 2.1 O137900200046 14.12 20. 52. 5. O137900200047 15.07 300. 55.6 2. O137900200048 16.79 300. 52.1 2.5 O137900200049 18.08 300. 53.5 3. O137900200050 19.32 300. 53. 3. O137900200051 20.47 300. 52.5 2.3 O137900200052 21.87 300. 53. 3. O137900200053 ENDDATA 42 0 O137900200054 ENDSUBENT 53 0 O137900299999 SUBENT O1379003 20060602 O026O137900300001 BIB 2 2 O137900300002 REACTION (1-H-2(D,P)1-H-3,,SIG/TMP,,SFC) O137900300003 MISC-COL (MISC) The solubility of hydrogen in hafnium. O137900300004 ENDBIB 2 0 O137900300005 COMMON 2 3 O137900300006 EN-ERR EN-ERR-DIG O137900300007 PER-CENT PER-CENT O137900300008 0.03 0.7 O137900300009 ENDCOMMON 3 0 O137900300010 DATA 5 24 O137900300011 EN-CM TEMP DATA DATA-ERR MISC O137900300012 KEV DEG-C B*KEV B*KEV NO-DIM O137900300013 3.853 200. 81. 8. 0.08 O137900300014 4.17 20. 46. 4. 1.8 O137900300015 4.38 20. 39. 5. O137900300016 4.63 200. 75. 6. O137900300017 4.66 20. 39.8 2.8 O137900300018 5.09 20. 38.3 2.8 O137900300019 5.53 200. 72. 4. O137900300020 5.72 20. 41. 8. O137900300021 6.29 20. 46. 4. O137900300022 6.32 200. 62. 5. O137900300023 7.03 20. 49. 3. O137900300024 7.14 200. 63. 4. O137900300025 7.99 200. 61. 4. O137900300026 8.31 20. 48.3 2.6 O137900300027 8.68 200. 57. 4. O137900300028 9.55 20. 46.7 2.9 O137900300029 9.92 200. 57. 6. O137900300030 10.56 20. 48. 5. O137900300031 11.21 200. 55. 4. O137900300032 11.48 20. 50.4 0.7 O137900300033 12.46 200. 52.8 2.5 O137900300034 12.76 20. 50. 1.7 O137900300035 14.24 200. 55. 4. O137900300036 14.74 20. 49. 3. O137900300037 ENDDATA 26 0 O137900300038 ENDSUBENT 37 0 O137900399999 ENDENTRY 3 0 O137999999999