ENTRY O1041 20190720 O071O104100000001 SUBENT O1041001 20190720 O071O104100100001 BIB 12 37 O104100100002 TITLE Isomeric cross section ratio for the formation of O104100100003 Se-73-m,g in various nuclear processes. O104100100004 AUTHOR (S.M.Qaim, A.Mushtaq, M.Uhl) O104100100005 INSTITUTE (2GERJUL) O104100100006 (2AUSIRK) O104100100007 REFERENCE (J,PR/C,38,645,1988) O104100100008 REL-REF (M,A0395001,F.Tarkanyi+,J,ARI,39,135,1988) Details of O104100100009 experiment. O104100100010 (M,A0467001,A.Mushtaq+,J,ARI,39,1085,1988) -DescriptionO104100100011 of uncertainties O104100100012 DETECTOR (GELI) O104100100013 FACILITY (CYCLO,2GERJUL) The Julich compact cyclotron CV-28 O104100100014 For 28-MeV alpha particles or 36-MeV He3 particles O104100100015 (ISOCY,2GERJUL) The isochronous cyclotron for 45-MeV O104100100016 protons and 56-MeV deutrons O104100100017 METHOD (STTA,BCINT) O104100100018 ERR-ANALYS (ERR-T) The total errors in the absolute cross sectionsO104100100019 for the formation of the ground state were about 16%. O104100100020 The errors in the isomeric cross section ratios ranged O104100100021 between 10 and 20%, the energy degradation calculation O104100100022 in the stacked foils also contained some error. It wasO104100100023 about +-0.5-MeV up to a projectile energy of 15-MeV andO104100100024 about +-0.3 MeV at higher energies. O104100100025 Description of the main partial uncertainties taken O104100100026 from A0467 (see REL-REF): O104100100027 (ERR-1) The error in the thickness of each foil O104100100028 (ERR-2) The error in the beam current measurement. O104100100029 (ERR-3) Absolute activity measurement of the products. O104100100030 DECAY-DATA (34-SE-73-G,7.1HR,DG,361.,0.97) O104100100031 (34-SE-73-M,40.MIN,DG,254.,0.025) O104100100032 ADD-RES (COMP) Statistical model calculations. Investigations O104100100033 on the Se-74(n,2n) reaction were performed. O104100100034 HISTORY (20030312C) O104100100035 (20030327U) Last checking has been done. O104100100036 (20190720A) SD: 'COREL' added to STATUS according to O104100100037 remark from Prof.S.M.Qaim. ERR-ANALYS updated. O104100100038 STATUS moved to Subents 002-008. O104100100039 ENDBIB 37 0 O104100100040 COMMON 3 3 O104100100041 ERR-1 ERR-2 ERR-3 O104100100042 PER-CENT PER-CENT PER-CENT O104100100043 4. 10. 15. O104100100044 ENDCOMMON 3 0 O104100100045 ENDSUBENT 44 0 O104100199999 SUBENT O1041002 20190720 O071O104100200001 BIB 6 12 O104100200002 REACTION (32-GE-70(A,N)34-SE-73-G,M+,SIG) O104100200003 METHOD (GSPEC) O104100200004 SAMPLE Thin samples were prepared by electrolytic deposition O104100200005 of Ge on copper backing. O104100200006 COMMENT -By authors* measurement of the 7.1-hr Se-73-g activityO104100200007 via gamma-ray spectrometry was relatively O104100200008 straight forward. The excitation function of the O104100200009 Ge-70(alpha,n)Se-73-g reaction could be determined in O104100200010 absolute terms since in the investigated energy range O104100200011 no other reaction contributions. O104100200012 STATUS (CURVE) Fig.2 from Phys.Rev.,C38(1988)645 O104100200013 HISTORY (20190720U) SD: STATUS added. O104100200014 ENDBIB 12 0 O104100200015 COMMON 1 3 O104100200016 EN-ERR-DIG O104100200017 MEV O104100200018 8.E-02 O104100200019 ENDCOMMON 3 0 O104100200020 DATA 3 24 O104100200021 EN DATA ERR-T O104100200022 MEV MB PER-CENT O104100200023 11.03 15. 27. O104100200024 12.23 47. 21. O104100200025 12.58 55. 22. O104100200026 12.65 150. 20. O104100200027 12.9 400. 23. O104100200028 13.18 200. 25. O104100200029 14.52 440. 23. O104100200030 14.75 500. 20. O104100200031 16.01 840. 19. O104100200032 17.23 770. 19. O104100200033 17.56 780. 21. O104100200034 18.76 1170. 21. O104100200035 19.96 920. 24. O104100200036 21.14 1080. 21. O104100200037 21.23 800. 23. O104100200038 21.42 1010. 23. O104100200039 22.58 920. 23. O104100200040 24.06 750. 24. O104100200041 24.64 510. 24. O104100200042 24.86 470. 23. O104100200043 25.91 420. 17. O104100200044 26.82 280. 21. O104100200045 27.84 170. 24. O104100200046 27.96 200. 20. O104100200047 ENDDATA 26 0 O104100200048 ENDSUBENT 47 0 O104100299999 SUBENT O1041003 20190720 O071O104100300001 BIB 7 19 O104100300002 REACTION (32-GE-70(A,N)34-SE-73-M/T,,SIG/RAT) O104100300003 METHOD (CHSEP,GSPEC) O104100300004 SAMPLE Thin samples were prepared by electrolytic deposition O104100300005 of Ge on copper backing. O104100300006 COMMENT - By authors. Measurement of Se-73-m in alpha particleO104100300007 induced reactions on Ge presented difficulty due to theO104100300008 strong copper matrix activity. After irradiation eachO104100300009 electroplated foil was therefore treated with 3 O104100300010 milliliters warm 3% hydrogen peroxide. The very thin O104100300011 layer of Ge and the radioselenium went in solution and O104100300012 thus got separated from the copper backing. O104100300013 A correction for the radiochemical yield was not O104100300014 necessary since only relative measurements were done. O104100300015 FLAG (1.).Experimental data were obtained via 254-keV gamma-O104100300016 line. O104100300017 (2.).Experimental data were obtained via growth and O104100300018 decay of Se-73-g. O104100300019 STATUS (CURVE) Fig.6 from Phys.Rev.,C38(1988)645 O104100300020 HISTORY (20190720U) SD: STATUS added. O104100300021 ENDBIB 19 0 O104100300022 COMMON 1 3 O104100300023 EN-ERR-DIG O104100300024 MEV O104100300025 7.E-02 O104100300026 ENDCOMMON 3 0 O104100300027 DATA 4 31 O104100300028 EN DATA ERR-T FLAG O104100300029 MEV NO-DIM NO-DIM NO-DIM O104100300030 12.99 0.79 9.E-02 2. O104100300031 13.1 0.63 6.E-02 2. O104100300032 13.3 0.67 6.E-02 1. O104100300033 14.26 0.59 7.E-02 1. O104100300034 14.67 0.54 6.E-02 1. O104100300035 15.17 0.56 6.E-02 1. O104100300036 15.88 0.5 6.E-02 1. O104100300037 16.23 0.53 5.E-02 1. O104100300038 16.84 0.51 7.E-02 1. O104100300039 17.5 0.45 7.E-02 2. O104100300040 17.7 0.52 5.E-02 1. O104100300041 17.85 0.47 7.E-02 2. O104100300042 18.56 0.52 5.E-02 1. O104100300043 19.46 0.52 6.E-02 1. O104100300044 20.12 0.43 5.E-02 1. O104100300045 21.38 0.42 6.E-02 2. O104100300046 21.39 0.38 3.E-02 1. O104100300047 21.44 0.36 4.E-02 1. O104100300048 21.59 0.45 4.E-02 2. O104100300049 22.8 0.42 6.E-02 1. O104100300050 24.27 0.41 5.E-02 1. O104100300051 24.78 0.31 4.E-02 1. O104100300052 24.86 0.363 2.E-02 2. O104100300053 24.87 0.39 4.E-02 2. O104100300054 24.88 0.4 4.E-02 1. O104100300055 25.23 0.38 6.E-02 1. O104100300056 26.58 0.51 6.E-02 1. O104100300057 27.74 0.47 4.E-02 1. O104100300058 27.75 0.374 7.E-03 2. O104100300059 27.8 0.343 7.E-03 1. O104100300060 27.81 0.41 2.5E-02 2. O104100300061 ENDDATA 33 0 O104100300062 ENDSUBENT 61 0 O104100399999 SUBENT O1041004 20190720 O071O104100400001 BIB 6 18 O104100400002 REACTION (32-GE-0(HE3,X)34-SE-73-M/T,,SIG/RAT) O104100400003 METHOD (CHSEP) O104100400004 SAMPLE Thin samples were prepared by electrolytic deposition O104100400005 of Ge on copper backing. O104100400006 COMMENT -By authors. In the case of HE3 induced process, onlyO104100400007 the effective cross section could be obtained due to O104100400008 the contribution of several reactions. O104100400009 Measurement of Se-73-m in alpha particle induced O104100400010 reactions on Ge presented difficulty due to the strongO104100400011 copper matrix activity. After irradiation each O104100400012 electroplated foil was therefore treated with 3 O104100400013 milliliters warm 3% hydrogen peroxide. The very thin O104100400014 layer of Ge and the radioselenium went in solution and O104100400015 thus got separated from the copper backing. O104100400016 A correction for the radiochemical yield was not O104100400017 necessary since only relative measurements were done. O104100400018 STATUS (CURVE) Fig.7 from Phys.Rev.,C38(1988)645 O104100400019 HISTORY (20190720U) SD: STATUS added. O104100400020 ENDBIB 18 0 O104100400021 COMMON 1 3 O104100400022 EN-ERR-DIG O104100400023 MEV O104100400024 6.E-02 O104100400025 ENDCOMMON 3 0 O104100400026 DATA 3 13 O104100400027 EN DATA ERR-T O104100400028 MEV NO-DIM NO-DIM O104100400029 13.01 0.66 8.E-02 O104100400030 13.6 0.58 8.E-02 O104100400031 15.31 0.61 8.E-02 O104100400032 16.83 0.39 5.E-02 O104100400033 16.92 0.51 4.E-02 O104100400034 17.22 0.44 4.E-02 O104100400035 18.79 0.46 5.E-02 O104100400036 20.02 0.4 6.E-02 O104100400037 20.32 0.41 5.E-02 O104100400038 21.9 0.53 6.E-02 O104100400039 23.05 0.44 4.E-02 O104100400040 23.26 0.46 3.E-02 O104100400041 23.9 0.45 4.E-02 O104100400042 ENDDATA 15 0 O104100400043 ENDSUBENT 42 0 O104100499999 SUBENT O1041005 20190720 O071O104100500001 BIB 7 18 O104100500002 REACTION (33-AS-75(P,3N)34-SE-73,,SIG) O104100500003 METHOD (GSPEC) O104100500004 (ACTIV) Several stacks were irradiated for 20 minutes O104100500005 at 50 nanoampere with 45 MeV protons O104100500006 SAMPLE Thin samples were prepared by electrolytic deposition O104100500007 of As on Cu or Al backing. O104100500008 COMMENT -By authors. The details on the measurement of the O104100500009 7.1-hr Se-73-g activity have already been described. O104100500010 See REL-REF. O104100500011 -By compiler. Experimental data which are shown on O104100500012 figure 3 contain a little differences from A0467003. O104100500013 Therefore data were scanned again. O104100500014 REL-REF (R,A0467003,A.Mushtaq+,J,ARI,39,1085,1988) O104100500015 STATUS (CURVE) Fig.3 from Phys.Rev.,C38(1988)645 O104100500016 (COREL,A0467003) g.s. cumulative cross section O104100500017 measured 5 h after irradiation O104100500018 HISTORY (20190720A) SD: 'COREL' added to STATUS according O104100500019 to remark from Prof.S.M.Qaim O104100500020 ENDBIB 18 0 O104100500021 COMMON 1 3 O104100500022 EN-ERR-DIG O104100500023 MEV O104100500024 8.E-02 O104100500025 ENDCOMMON 3 0 O104100500026 DATA 3 44 O104100500027 EN DATA ERR-T O104100500028 MEV MB PER-CENT O104100500029 24.83 14.4 18. O104100500030 25.19 32. 13. O104100500031 26.07 48. 15. O104100500032 26.54 92. 13. O104100500033 27.18 92. 11. O104100500034 27.71 115. 13. O104100500035 27.89 200. 20. O104100500036 28.24 172. 16. O104100500037 29.06 230. 12. O104100500038 30.05 250. 12. O104100500039 30.17 310. 13. O104100500040 30.52 322. 8. O104100500041 30.7 300. 10. O104100500042 31.17 370. 14. O104100500043 31.46 320. 9. O104100500044 31.69 300. 13. O104100500045 32.16 290. 14. O104100500046 32.62 330. 12. O104100500047 32.97 310. 13. O104100500048 33.38 380. 11. O104100500049 33.85 360. 17. O104100500050 34.08 340. 18. O104100500051 34.9 370. 14. O104100500052 35.31 310. 16. O104100500053 35.95 380. 13. O104100500054 36.36 360. 17. O104100500055 37.12 310. 13. O104100500056 37.41 350. 14. O104100500057 38.22 290. 17. O104100500058 38.4 280. 14. O104100500059 39.15 240. 17. O104100500060 39.51 260. 12. O104100500061 39.97 226. 10. O104100500062 40.21 280. 11. O104100500063 40.44 260. 12. O104100500064 41.08 223. 13. O104100500065 41.78 190. 16. O104100500066 42.13 250. 16. O104100500067 42.42 240. 17. O104100500068 43.18 167. 16. O104100500069 43.47 157. 14. O104100500070 43.99 152. 14. O104100500071 44.34 157. 15. O104100500072 44.81 147. 18. O104100500073 ENDDATA 46 0 O104100500074 ENDSUBENT 73 0 O104100599999 SUBENT O1041006 20190720 O071O104100600001 BIB 7 18 O104100600002 REACTION (33-AS-75(D,4N)34-SE-73,,SIG) O104100600003 METHOD (GSPEC) O104100600004 (ACTIV) Several stacks were irradiated for 20 minutes O104100600005 at 50 nanoampere with 56 MeV deutrons. O104100600006 SAMPLE Thin samples were prepared by electrolytic deposition O104100600007 of As on Cu or Al backing. O104100600008 COMMENT -By authors. The details on the measurement of the O104100600009 7.1-hr Se-73-g activity have already been described. O104100600010 See REL-REF. O104100600011 -By compiler. Experimental data which are shown on O104100600012 figure 4 contain a little differences from A0467006. O104100600013 Therefore data were scanned again. O104100600014 REL-REF (R,A0467006,A.Mushtaq+,J,ARI,39,1085,1988) O104100600015 STATUS (CURVE) Fig.4 from Phys.Rev.,C38(1988)645 O104100600016 (COREL,A0467006) g.s. cumulative cross section O104100600017 measured 5 h after irradiation O104100600018 HISTORY (20190720A) SD: 'COREL' added to STATUS according O104100600019 to remark from Prof.S.M.Qaim. O104100600020 ENDBIB 18 0 O104100600021 COMMON 1 3 O104100600022 EN-ERR-DIG O104100600023 MEV O104100600024 0.12 O104100600025 ENDCOMMON 3 0 O104100600026 DATA 3 53 O104100600027 EN DATA ERR-T O104100600028 MEV MB PER-CENT O104100600029 27.82 7.2 13. O104100600030 28.67 14.7 11. O104100600031 29. 16.7 13. O104100600032 29.25 17.8 9. O104100600033 29.33 19.4 10. O104100600034 29.84 27. 15. O104100600035 31.27 61. 15. O104100600036 32.01 66. 15. O104100600037 32.09 65. 9. O104100600038 32.51 91. 14. O104100600039 33.17 91. 14. O104100600040 33.92 106. 14. O104100600041 34.09 143. 15. O104100600042 35.5 174. 16. O104100600043 35.83 146. 20. O104100600044 36.65 166. 15. O104100600045 37.48 197. 15. O104100600046 37.73 189. 14. O104100600047 38.22 190. 16. O104100600048 38.63 185. 16. O104100600049 39.3 200. 20. O104100600050 39.62 184. 13. O104100600051 40.79 240. 17. O104100600052 41.01 219. 16. O104100600053 41.2 230. 13. O104100600054 42.68 240. 17. O104100600055 43.01 218. 14. O104100600056 43.58 220. 14. O104100600057 44.32 213. 14. O104100600058 44.65 220. 14. O104100600059 44.9 222. 12. O104100600060 45.8 195. 14. O104100600061 46.05 208. 13. O104100600062 46.3 199. 11. O104100600063 46.47 227. 11. O104100600064 47.45 170. 18. O104100600065 47.78 190. 21. O104100600066 48.36 199. 14. O104100600067 49.1 164. 15. O104100600068 49.51 170. 18. O104100600069 50. 171. 16. O104100600070 50.49 147. 14. O104100600071 50.69 151. 15. O104100600072 50.9 147. 17. O104100600073 51.97 140. 13. O104100600074 52.05 131. 12. O104100600075 52.63 118. 14. O104100600076 52.73 140. 15. O104100600077 52.88 140. 16. O104100600078 53.46 143. 12. O104100600079 53.95 120. 13. O104100600080 54.94 125. 14. O104100600081 55.27 125. 14. O104100600082 ENDDATA 55 0 O104100600083 ENDSUBENT 82 0 O104100699999 SUBENT O1041007 20190720 O071O104100700001 BIB 7 13 O104100700002 REACTION (33-AS-75(P,3N)34-SE-73-M/T,,SIG/RAT) O104100700003 SAMPLE Thin samples were prepared by electrolytic deposition O104100700004 of As on Cu or Al backing. O104100700005 METHOD (GSPEC) O104100700006 (ACTIV) Several stacks were irradiated for 20 minutes O104100700007 at 50 nanoampere with 45 MeV protons O104100700008 COMMENT -By authors. In the case of Se-73-m electroplating wasO104100700009 done invariably on Al backing to suppress the matrix O104100700010 activity. Measurement could then be done without O104100700011 chemical separation. O104100700012 REL-REF (R,A0467003,A.Mushtaq+,J,ARI,39,1085,1988) O104100700013 STATUS (CURVE) Fig.8 from Phys.Rev.,C38(1988)645 O104100700014 HISTORY (20190720U) SD: STATUS added. O104100700015 ENDBIB 13 0 O104100700016 COMMON 1 3 O104100700017 EN-ERR-DIG O104100700018 MEV O104100700019 9.E-02 O104100700020 ENDCOMMON 3 0 O104100700021 DATA 3 17 O104100700022 EN DATA ERR-T O104100700023 MEV NO-DIM NO-DIM O104100700024 24.89 0.44 5.E-02 O104100700025 26.14 0.4 4.E-02 O104100700026 27.26 0.52 3.E-02 O104100700027 28.32 0.42 4.E-02 O104100700028 29.31 0.39 4.E-02 O104100700029 30.81 0.48 4.E-02 O104100700030 32.18 0.45 4.E-02 O104100700031 33.49 0.44 3.E-02 O104100700032 34.86 0.5 4.E-02 O104100700033 36.1 0.43 4.E-02 O104100700034 37.04 0.43 4.E-02 O104100700035 38.16 0.4 4.E-02 O104100700036 39.28 0.46 5.E-02 O104100700037 40.02 0.417 2.7E-02 O104100700038 41.83 0.42 3.E-02 O104100700039 43.45 0.39 4.E-02 O104100700040 44.88 0.42 4.E-02 O104100700041 ENDDATA 19 0 O104100700042 ENDSUBENT 41 0 O104100799999 SUBENT O1041008 20190720 O071O104100800001 BIB 7 13 O104100800002 REACTION (33-AS-75(D,4N)34-SE-73-M/T,,SIG/RAT) O104100800003 SAMPLE Thin samples were prepared by electrolytic deposition O104100800004 of As on Cu or Al backing. O104100800005 METHOD (GSPEC) O104100800006 (ACTIV) Several stacks were irradiated for 20 minutes O104100800007 at 50 nanoampere with 56 MeV deutrons O104100800008 COMMENT -By authors. In the case of Se-73-m electroplating wasO104100800009 done invariably on Al backing to suppress the matrix O104100800010 activity. Measurement could then be done without O104100800011 chemical separation. O104100800012 REL-REF (R,A0467006,A.Mushtaq+,J,ARI,39,1085,1988) O104100800013 STATUS (CURVE) Fig.9 from Phys.Rev.,C38(1988)645 O104100800014 HISTORY (20190720U) SD: STATUS added. O104100800015 ENDBIB 13 0 O104100800016 COMMON 1 3 O104100800017 EN-ERR-DIG O104100800018 MEV O104100800019 0.13 O104100800020 ENDCOMMON 3 0 O104100800021 DATA 3 18 O104100800022 EN DATA ERR-T O104100800023 MEV NO-DIM NO-DIM O104100800024 27.82 0.45 5.E-02 O104100800025 29.8 0.45 6.E-02 O104100800026 32.06 0.45 5.E-02 O104100800027 35.64 0.44 6.E-02 O104100800028 37.41 0.36 4.E-02 O104100800029 39.39 0.35 5.E-02 O104100800030 41.1 0.44 5.E-02 O104100800031 42.88 0.38 4.E-02 O104100800032 44.38 0.38 5.E-02 O104100800033 46.09 0.45 5.E-02 O104100800034 47.32 0.5 6.E-02 O104100800035 49.28 0.41 6.E-02 O104100800036 50.32 0.39 4.E-02 O104100800037 51.92 0.38 4.E-02 O104100800038 52.57 0.37 5.E-02 O104100800039 53.33 0.38 5.E-02 O104100800040 54.75 0.46 4.E-02 O104100800041 55.11 0.37 4.E-02 O104100800042 ENDDATA 20 0 O104100800043 ENDSUBENT 42 0 O104100899999 ENDENTRY 8 0 O104199999999