ENTRY O0898 20030502 0000O089800000001 SUBENT O0898001 20030502 0000O089800100001 BIB 8 17 O089800100002 TITLE Low-energy S(E) factor of 9-Be(P,A)6-Li and O089800100003 9-Be(P,D)8-Be O089800100004 REFERENCE (J,ZP/A,359,211,1997) O089800100005 AUTHOR (D.Zahnow, C.Rolfs, S.Schmidt, H.P.Trautvetter) O089800100006 INSTITUTE (2GERBOC) O089800100007 FACILITY (CCW,2GERBOC) The 100 and 400 kilovolts accelerators O089800100008 the energy spread for 100-KeV accelerator = 10. EV O089800100009 the energy spread for 400-KeV accelerator = 0.1 KeV O089800100010 REL-REF (A,F0169001,A.J.SIERK+,J,NP/A,210,341,1973) O089800100011 The data are in fair agreement with Rel-Ref at O089800100012 overlapping energies. O089800100013 ADD-RES (COMP) Fit parameters of the excitation functions and O089800100014 angular distributions for investigated reactions. An O089800100015 electron screening potential energy of 900 +/- 50 eV. O089800100016 HISTORY (20010809C) O089800100017 (20010808R) Data tables for angilar distribution O089800100018 (20030502U) Last checking has been done. O089800100019 ENDBIB 17 0 O089800100020 NOCOMMON 0 0 O089800100021 ENDSUBENT 20 0 O089800199999 SUBENT O0898002 20030502 0000O089800200001 BIB 9 46 O089800200002 REACTION (4-BE-9(P,A)3-LI-6,,DA,,LEG/RS) O089800200003 PART-DET (A) O089800200004 DETECTOR (SIBAR) Five passivated implanted silicon detectors O089800200005 were installed in the scattering chamber at the angles O089800200006 60., 90., 105., 150 degrees with respect to the beam O089800200007 direction. O089800200008 METHOD (SITA) Berillium target was oriented with its normal O089800200009 at 135 degrees to the beam direction. Another details O089800200010 - see sample. O089800200011 (EXTB) The accelerators provided H1+, H2+, H3+ hydrogenO089800200012 beams. O089800200013 ERR-ANALYS (EN-ERR1) The uncertainty in the absolute energy of O089800200014 100-KeV accelerator. O089800200015 (EN-ERR3) The uncertainty in the absolute energy of O089800200016 400-KeV accelerator. O089800200017 (ANG-ERR) The maximal value of scattering angle O089800200018 uncertainty O089800200019 (DATA-ERR) Noany analysis is presented O089800200020 SAMPLE The evaporated berillium film thickness was monitored -O089800200021 during the fabrication - with a quartz oscillator O089800200022 gauge. O089800200023 Target thickness was to be 10 microgramm/cm**2. The O089800200024 target was deposited on cooled copper backing. A O089800200025 liquid-nitrogen cooled copper shroud was installed nearO089800200026 the target holder to minimie carbon deposition on the O089800200027 target. O089800200028 REL-REF (N,,D.ZAHNOW,T,ZAHNOW,1997) MONTE CARLO simulating O089800200029 code. O089800200030 COMMENT - By authors. The MONTE CARLO simulating program O089800200031 included: O089800200032 1. The setup geometry, O089800200033 2. The spot sie of the ion beam at the target, O089800200034 3. The energy loss and the energy straggling of the O089800200035 projectiles and ejectiles in the target, in the foils O089800200036 covering the detectors, and in the dead layer of the O089800200037 detectors, O089800200038 4. The kinematics of the ejectiles, O089800200039 5. The intrinsic energy resolution of the detectors O089800200040 the simulated spectra were fitted to measured spectra O089800200041 with well-resolved peaks of the ejectiles; this O089800200042 fitting allowed to determine the energy calibration of O089800200043 the spectra, the thickness of the foils and of the deadO089800200044 layers, and the intrinsic energy resolution of the O089800200045 detectors. O089800200046 FLAG (1.) The result is presented in data table two times. O089800200047 It is misprint probably O089800200048 ENDBIB 46 0 O089800200049 COMMON 4 3 O089800200050 EN-ERR1 EN-ERR3 ANG-ERR NUMBER-CM O089800200051 EV KEV ADEG NO-DIM O089800200052 25. 0.5 0.6 1. O089800200053 ENDCOMMON 3 0 O089800200054 DATA 4 64 O089800200055 EN DATA DATA-ERR FLAG O089800200056 KEV NO-DIM NO-DIM NO-DIM O089800200057 24.91 0.27 0.04 O089800200058 29.89 0.26 0.02 O089800200059 39.8 0.23 0.02 O089800200060 42.8 0.25 0.03 O089800200061 44.92 0.2 0.03 O089800200062 47.74 0.24 0.03 O089800200063 49.8 0.24 0.02 O089800200064 53.08 0.16 0.03 O089800200065 54.78 0.22 0.03 O089800200066 58.2 0.19 0.03 O089800200067 59.76 0.2 0.01 O089800200068 63.36 0.2 0.03 O089800200069 64.73 0.2 0.03 O089800200070 68.4 0.21 0.03 O089800200071 69.71 0.22 0.01 O089800200072 69.71 0.21 0.03 O089800200073 73.64 0.21 0.03 O089800200074 74.7 0.21 0.03 O089800200075 78.78 0.23 0.03 O089800200076 79.67 0.22 0.02 O089800200077 83.92 0.21 0.02 O089800200078 84.82 0.21 0.02 O089800200079 89.06 0.21 0.02 O089800200080 89.8 0.2 0.02 O089800200081 94.2 0.19 0.02 O089800200082 94.61 0.21 0.02 O089800200083 99.3 0.21 0.03 O089800200084 99.58 0.2 0.02 O089800200085 104.5 0.19 0.02 O089800200086 109.7 0.19 0.02 O089800200087 114.9 0.19 0.02 O089800200088 119.9 0.18 0.02 O089800200089 125.2 0.19 0.02 O089800200090 130.3 0.19 0.02 O089800200091 135.4 0.19 0.02 O089800200092 140.3 0.18 0.02 O089800200093 150.5 0.19 0.02 O089800200094 161. 0.17 0.02 O089800200095 171.3 0.17 0.02 1. O089800200096 181.4 0.17 0.02 O089800200097 181.6 0.16 0.04 O089800200098 190.8 0.13 0.02 O089800200099 190.8 0.17 0.04 O089800200100 201.1 0.16 0.04 O089800200101 211.4 0.15 0.04 O089800200102 221.7 0.13 0.04 O089800200103 232. 0.13 0.04 O089800200104 242.3 0.13 0.03 O089800200105 252.5 0.14 0.04 O089800200106 262.8 0.12 0.04 O089800200107 274.1 0.09 0.04 O089800200108 284.4 0.06 0.04 O089800200109 294.7 0.05 0.01 O089800200110 305. 0.06 0.04 O089800200111 314.8 0.03 0.04 O089800200112 325.3 0.05 0.04 O089800200113 325.6 -0.01 0.06 O089800200114 335.8 -0.05 0.06 O089800200115 346.1 -0.05 0.07 O089800200116 356.4 -0.07 0.07 O089800200117 366.6 -0.09 0.07 O089800200118 376.9 -0.1 0.07 O089800200119 387.2 -0.09 0.07 O089800200120 397.5 -0.09 0.07 O089800200121 ENDDATA 66 0 O089800200122 ENDSUBENT 121 0 O089800299999 SUBENT O0898003 20030502 0000O089800300001 BIB 9 47 O089800300002 REACTION (4-BE-9(P,D)4-BE-8,,DA,,LEG/RS) O089800300003 PART-DET (D) O089800300004 DETECTOR (SIBAR) Five passivated implanted silicon detectors O089800300005 were installed in the scattering chamber at the angles O089800300006 60., 90., 105., 150 degrees with respect to the beam O089800300007 direction. O089800300008 METHOD (SITA) Berillium target was oriented with its normal O089800300009 at 135 degrees to the beam direction. Another details O089800300010 - see sample. O089800300011 (EXTB) The accelerators provided H1+, H2+, H3+ hydrogenO089800300012 beams. O089800300013 ERR-ANALYS (EN-ERR1) The uncertainty in the absolute energy of O089800300014 100-KeV accelerator. O089800300015 (EN-ERR3) The uncertainty in the absolute energy of O089800300016 400-KeV accelerator. O089800300017 (ANG-ERR) The maximal value of scattering angle O089800300018 uncertainty O089800300019 (DATA-ERR) Noany analysis is presented. O089800300020 SAMPLE The evaporated berillium film thickness was monitored -O089800300021 during the fabrication - with a quartz oscillator O089800300022 gauge. O089800300023 Target thickness was to be 10 microgramm/cm**2. The O089800300024 target was deposited on cooled copper backing. A O089800300025 liquid-nitrogen cooled copper shroud was installed nearO089800300026 the target holder to minimie carbon deposition on the O089800300027 target. O089800300028 REL-REF (N,,D.ZAHNOW,T,ZAHNOW,1997) MONTE CARLO simulating O089800300029 code. O089800300030 COMMENT - By authors - the MONTE CARLO simulating program O089800300031 included: O089800300032 1. The setup geometry, O089800300033 2. The spot sie of the ion beam at the target, O089800300034 3. The energy loss and the energy straggling of the O089800300035 projectiles and ejectiles in the target, in the foils O089800300036 covering the detectors, and in the dead layer of the O089800300037 detectors, O089800300038 4. The kinematics of the ejectiles, O089800300039 5. The intrinsic energy resolution of the detectors O089800300040 the simulated spectra were fitted to measured spectra O089800300041 with well-resolved peaks of the ejectiles; this O089800300042 fitting allowed to determine the energy calibration of O089800300043 the spectra, the thickness of the foils and of the deadO089800300044 layers, and the intrinsic energy resolution of the O089800300045 detectors. O089800300046 FLAG (1.) The result is presented in data table two times. O089800300047 It is misprint probably O089800300048 (2.) The uncertainty is absent in data table. O089800300049 ENDBIB 47 0 O089800300050 COMMON 3 3 O089800300051 EN-ERR1 EN-ERR3 ANG-ERR O089800300052 EV KEV ADEG O089800300053 25. 0.5 0.6 O089800300054 ENDCOMMON 3 0 O089800300055 DATA 5 71 O089800300056 EN NUMBER-CM DATA DATA-ERR FLAG O089800300057 KEV NO-DIM NO-DIM NO-DIM NO-DIM O089800300058 24.91 1. -0.21 0.2 O089800300059 29.89 1. -0.35 0.06 O089800300060 39.8 1. -0.38 0.01 O089800300061 42.8 1. -0.4 0.07 O089800300062 44.92 1. -0.37 0.07 O089800300063 47.74 1. -0.46 0.07 O089800300064 49.8 1. -0.46 0.04 O089800300065 53.08 1. -0.45 0.08 O089800300066 54.78 1. -0.4 0.07 O089800300067 58.2 1. -0.36 0.07 O089800300068 59.76 1. -0.38 0.03 O089800300069 63.36 1. -0.37 0.06 O089800300070 64.73 1. -0.37 0.05 O089800300071 68.4 1. -0.38 0.06 O089800300072 69.71 1. -0.31 0.05 O089800300073 69.71 1. -0.35 0.02 O089800300074 73.64 1. -0.31 0.05 O089800300075 74.7 1. -0.32 0.05 O089800300076 78.78 1. -0.33 0.05 O089800300077 79.67 1. -0.35 0.05 O089800300078 83.92 1. -0.31 0.05 O089800300079 84.82 1. -0.28 0.04 O089800300080 89.06 1. -0.27 0.04 O089800300081 89.8 1. -0.29 0.04 O089800300082 94.2 1. -0.28 0.04 O089800300083 94.61 1. -0.3 0.04 O089800300084 99.3 1. -0.28 0.04 O089800300085 99.58 1. -0.28 0.04 O089800300086 104.5 1. -0.24 0.04 O089800300087 109.7 1. -0.26 0.04 O089800300088 114.9 1. -0.23 0.04 O089800300089 119.9 1. -0.22 0.04 O089800300090 125.2 1. -0.23 2. O089800300091 130.3 1. 0. 0.04 O089800300092 135.4 1. -0.18 0.04 O089800300093 140.3 1. -0.16 0.04 O089800300094 150.5 1. -0.16 0.04 O089800300095 161. 1. -0.14 0.04 O089800300096 171.3 1. -0.11 0.04 1. O089800300097 181.4 1. -0.15 0.04 O089800300098 181.6 1. -0.09 0.04 O089800300099 190.8 1. -0.05 0.04 O089800300100 190.8 1. -0.13 0.04 O089800300101 201.1 1. -0.04 0.04 O089800300102 211.4 1. -0.02 0.04 O089800300103 221.7 1. -0.03 0.04 O089800300104 232. 1. -0.01 0.04 O089800300105 242.3 1. 0.02 0.04 O089800300106 252.5 1. 0.04 0.04 O089800300107 262.8 1. 0.05 0.04 O089800300108 274.1 1. 0.04 0.04 O089800300109 284.4 1. 0.04 0.04 O089800300110 294.7 1. 0.07 0.04 O089800300111 305. 1. 0.08 0.04 O089800300112 314.8 1. 0.08 0.04 O089800300113 325.3 1. 0.14 0.04 O089800300114 325.6 1. 0.14 0.06 O089800300115 335.8 1. 0.15 0.05 O089800300116 335.8 2. -0.03 0.1 O089800300117 346.1 1. 0.13 0.1 O089800300118 346.1 2. -0.07 0.1 O089800300119 356.4 1. 0.15 0.09 O089800300120 356.4 2. -0.06 0.09 O089800300121 366.6 1. 0.16 0.09 O089800300122 366.6 2. -0.07 0.08 O089800300123 376.9 1. 0.19 0.09 O089800300124 376.9 2. -0.07 0.08 O089800300125 387.2 1. 0.17 0.09 O089800300126 387.2 2. -0.07 0.08 O089800300127 397.5 1. 0.05 0.09 O089800300128 397.5 2. -0.17 0.07 O089800300129 ENDDATA 73 0 O089800300130 ENDSUBENT 129 0 O089800399999 SUBENT O0898004 20030502 0000O089800400001 BIB 8 45 O089800400002 REACTION (4-BE-9(P,A)3-LI-6,,SIG,,SFC) O089800400003 METHOD (SITA) See sample O089800400004 (BCINT) The target together with the chamber and the O089800400005 detector holders formed the faraday cup O089800400006 (EXTB) O089800400007 PART-DET (A) O089800400008 DETECTOR (SIBAR) Four passived inplanted silicon detectors were O089800400009 placed at 130 degrees around of beam axis and at a O089800400010 distance of 42 millimeters. O089800400011 ERR-ANALYS (ERR-1) The precision of beam current measurements. O089800400012 (ERR-2) The uncertainty for absolute solid angle. O089800400013 (ERR-3) The uncertainty of detection angle. O089800400014 (ERR-4) The uncertainty of target composition. O089800400015 (ERR-5) The uncertainty of stopping power. O089800400016 (ERR-T) Errors qouted arise from uncertainties in the O089800400017 number of counts, incident proton energy, angular O089800400018 distribution, and target deterioration. All values haveO089800400019 a common additional error of 13% due to uncertainties O089800400020 in current measurement, absolute solid angle, detectionO089800400021 angle, target composition and stopping power. O089800400022 SAMPLE Four target were used: O089800400023 1. 10 microgramm/cm**2. The target was used for 71-330 O089800400024 KeV. O089800400025 2. 20 microgramm/cm**2. The target was used for 20-100 O089800400026 KeV. O089800400027 3. 100 microgramm/cm**2. The target was used for 18,20 O089800400028 KeV O089800400029 4. 100 microgramm/cm**2. The target was used for 16 KeVO089800400030 the thicknesses obtained from quartz oscillator gauge O089800400031 during target fabrication. O089800400032 Target #1 and #2 were bombarded at higher energies withO089800400033 relatively low proton dose. For the targets, the O089800400034 observed reaction yields at the reference energies O089800400035 stayed constant in time within 3%. O089800400036 Targets #3 and #4 were used in the lowest energies and O089800400037 bombarded each with 100 coulomb accumulated charge. O089800400038 Linear relationship between yield and accumulated O089800400039 charge. The targets stability was tested every 2 hours O089800400040 of running time via the reaction yield at 60 KeV. O089800400041 CORRECTION Needed corrections for thickness target changing and O089800400042 energy shift due to carbon deposition were applied. O089800400043 MISC-COL (MISC1) The number of used target. O089800400044 (MISC2) The energy of used accelerator. O089800400045 (MISC3) The mass - in atomic mass unit - of one chargedO089800400046 hydrogen ion of beam. O089800400047 ENDBIB 45 0 O089800400048 COMMON 5 3 O089800400049 ERR-1 ERR-2 ERR-3 ERR-4 ERR-5 O089800400050 PER-CENT PER-CENT PER-CENT PER-CENT PER-CENT O089800400051 3. 3. 1. 7. 10. O089800400052 ENDCOMMON 3 0 O089800400053 DATA 6 33 O089800400054 EN DATA ERR-T MISC1 MISC2 MISC3 O089800400055 KEV B*MEV B*MEV NO-DIM KEV NO-DIM O089800400056 15.93 51. 16. 4. 100. 3.O089800400057 17.93 47. 15. 3. 100. 3.O089800400058 19.92 35. 4. 3. 100. 3.O089800400059 19.93 28. 7. 2. 100. 3.O089800400060 21.92 27.7 1.7 2. 100. 3.O089800400061 22.92 26.9 1.9 2. 100. 3.O089800400062 24.9 25.8 1.7 2. 100. 3.O089800400063 29.88 27.2 0.9 2. 100. 3.O089800400064 29.9 26.4 1.2 2. 100. 1.O089800400065 34.88 26.9 1. 2. 100. 1.O089800400066 39.85 25.1 0.7 2. 100. 1.O089800400067 49.8 25.3 0.4 2. 100. 1.O089800400068 59.8 22. 0.4 2. 100. 1.O089800400069 59.9 24.3 0.6 2. 100. 1.O089800400070 69.7 24.3 0.6 2. 100. 1.O089800400071 70.6 22.5 1.3 1. 400. 1.O089800400072 79.7 24. 1.7 2. 100. 1.O089800400073 80.5 22.3 0.8 1. 400. 1.O089800400074 89.7 23.3 0.6 2. 100. 1.O089800400075 99.6 24.4 0.6 2. 100. 1.O089800400076 100. 25.6 0.6 1. 400. 1.O089800400077 120. 27.8 1.3 1. 400. 1.O089800400078 140. 31.2 1.2 1. 400. 1.O089800400079 160. 35.1 1.3 1. 400. 1.O089800400080 180. 39. 1.1 1. 400. 1.O089800400081 200. 45. 1.8 1. 400. 1.O089800400082 220. 53.6 2.1 1. 400. 1.O089800400083 240. 66.8 2.4 1. 400. 1.O089800400084 260. 78. 2. 1. 400. 1.O089800400085 280. 93. 3. 1. 400. 1.O089800400086 300. 101. 4. 1. 400. 1.O089800400087 320. 101. 4. 1. 400. 1.O089800400088 330. 90. 8. 1. 400. 1.O089800400089 ENDDATA 35 0 O089800400090 ENDSUBENT 89 0 O089800499999 SUBENT O0898005 20030502 0000O089800500001 BIB 8 45 O089800500002 REACTION (4-BE-9(P,D)4-BE-8,,SIG,,SFC) O089800500003 METHOD (SITA) See sample O089800500004 (BCINT) The target together with the chamber and the O089800500005 detector holders formed the faraday cup O089800500006 (EXTB) O089800500007 PART-DET (D) O089800500008 DETECTOR (SIBAR) Four passived inplanted silicon detectors were O089800500009 placed at 130 degrees around of beam axis and at a O089800500010 distance of 42 millimeters. O089800500011 ERR-ANALYS (ERR-1) The precision of beam current measurements. O089800500012 (ERR-2) The uncertainty for absolute solid angle. O089800500013 (ERR-3) The uncertainty of detection angle. O089800500014 (ERR-4) The uncertainty of target composition. O089800500015 (ERR-5) The uncertainty of stopping power. O089800500016 (ERR-T) Errors qouted arise from uncertainties in the O089800500017 number of counts, incident proton energy, angular O089800500018 distribution, and target deterioration. All values haveO089800500019 a common additional error of 13% due to uncertainties O089800500020 in current measurement, absolute solid angle, detectionO089800500021 angle, target composition and stopping power. O089800500022 SAMPLE Four target were used: O089800500023 1. 10 microgramm/cm**2. The target was used for 71-330 O089800500024 KeV. O089800500025 2. 20 microgramm/cm**2. The target was used for 20-100 O089800500026 KeV. O089800500027 3. 100 microgramm/cm**2. The target was used for 18,20 O089800500028 KeV O089800500029 4. 100 microgramm/cm**2. The target was used for 16 KeVO089800500030 the thicknesses obtained from quartz oscillator gauge O089800500031 during target fabrication. O089800500032 Target #1 and #2 were bombarded at higher energies withO089800500033 relatively low proton dose. For the targets, the O089800500034 observed reaction yields at the reference energies O089800500035 stayed constant in time within 3%. O089800500036 Targets #3 and #4 were used in the lowest energies and O089800500037 bombarded each with 100 coulomb accumulated charge. O089800500038 Linear relationship between yield and accumulated O089800500039 charge. The targets stability was tested every 2 hours O089800500040 of running time via the reaction yield at 60 KeV. O089800500041 CORRECTION Needed corrections for thickness target changing and O089800500042 energy shift due to carbon deposition were applied. O089800500043 MISC-COL (MISC1) The number of used target. O089800500044 (MISC2) The energy of used accelerator. O089800500045 (MISC3) The mass - in atomic mass unit - of one chargedO089800500046 hydrogen ion of beam. O089800500047 ENDBIB 45 0 O089800500048 COMMON 5 3 O089800500049 ERR-1 ERR-2 ERR-3 ERR-4 ERR-5 O089800500050 PER-CENT PER-CENT PER-CENT PER-CENT PER-CENT O089800500051 3. 3. 1. 7. 10. O089800500052 ENDCOMMON 3 0 O089800500053 DATA 6 33 O089800500054 EN DATA ERR-T MISC1 MISC2 MISC3 O089800500055 KEV B*MEV B*MEV NO-DIM KEV NO-DIM O089800500056 15.93 53. 16. 4. 100. 3.O089800500057 17.93 51. 17. 3. 100. 3.O089800500058 19.92 36. 4. 3. 100. 3.O089800500059 19.93 26. 7. 2. 100. 3.O089800500060 21.92 27.7 1.9 2. 100. 3.O089800500061 22.92 26.6 2.1 2. 100. 3.O089800500062 24.9 27. 2.1 2. 100. 3.O089800500063 29.88 25.9 1.4 2. 100. 3.O089800500064 29.9 26.6 1.5 2. 100. 1.O089800500065 34.88 25.2 1.3 2. 100. 1.O089800500066 39.85 24.6 1. 2. 100. 1.O089800500067 49.8 22.8 0.6 2. 100. 1.O089800500068 59.8 20.5 0.5 2. 100. 1.O089800500069 59.9 21.7 0.8 2. 100. 1.O089800500070 69.7 23.4 0.8 2. 100. 1.O089800500071 70.6 20.6 1.2 1. 400. 1.O089800500072 79.7 22.6 0.9 2. 100. 1.O089800500073 80.5 21.4 0.8 1. 400. 1.O089800500074 89.7 22.7 0.9 2. 100. 1.O089800500075 99.6 23.4 0.6 2. 100. 1.O089800500076 100. 25. 0.6 1. 400. 1.O089800500077 120. 28.4 0.9 1. 400. 1.O089800500078 140. 32.4 1. 1. 400. 1.O089800500079 160. 37.2 1.1 1. 400. 1.O089800500080 180. 42.4 0.9 1. 400. 1.O089800500081 200. 50.6 1.6 1. 400. 1.O089800500082 220. 61.6 1.9 1. 400. 1.O089800500083 240. 78.7 2.4 1. 400. 1.O089800500084 260. 94.1 2.1 1. 400. 1.O089800500085 280. 113. 4. 1. 400. 1.O089800500086 300. 124. 4. 1. 400. 1.O089800500087 320. 123. 4. 1. 400. 1.O089800500088 330. 121. 9. 1. 400. 1.O089800500089 ENDDATA 35 0 O089800500090 ENDSUBENT 89 0 O089800599999 ENDENTRY 5 0 O089899999999