ENTRY            F0658   20090615                             F036F065800000001 
SUBENT        F0658001   20090615                             F036F065800100001 
BIB                 10         31                                 F065800100002 
TITLE      Resonances in low energy elastic scattering of alpha   F065800100003 
           particles from 28Si.                                   F065800100004 
AUTHOR     (J.J.Lawrie,A.A.Cowley,D.M.Whittal,S.J.Mills,          F065800100005 
           W.R.McMurray)                                          F065800100006 
INSTITUTE  (3SAFNAC)                                              F065800100007 
REFERENCE  (J,ZP/A,325,175,1986)                                  F065800100008 
FACILITY   (VDG)   6 MV                                           F065800100009 
DETECTOR   (SI) The 100 mu silicon detectors mounted on           F065800100010 
           rotatable arms, with an angular accuracy of 0.1 degr.  F065800100011 
           Circular detector collimators subtended a solid angle  F065800100012 
           of 0.5 msr with an angular acceptance of 0.8 degr.     F065800100013 
SAMPLE     The target consisted of 250 mu-g/cm2 natural silicon   F065800100014 
           evaporated onto a backing consisting of a 40 mu-g/cm2  F065800100015 
           gold layer on a KAPTON film.                           F065800100016 
MONITOR    Forward angle elastic scattering from a thin gold      F065800100017 
           target, measured on both sides of the beam, was used toF065800100018 
           determine the angular offset of the angle              F065800100019 
           determinations.                                        F065800100020 
           Rutherford scattering from the thin gold layer         F065800100021 
           sandwiched between the silicon target material and the F065800100022 
           KAPTON backing, was used to monitor the total incident F065800100023 
           flux.                                                  F065800100024 
ERR-ANALYS (ERR-S)Statistical error                               F065800100025 
           (ERR-SYS)Systematic error in the measured cross sectionF065800100026 
           values, which is mainly due to uncertainties in the    F065800100027 
           silicon and gold target thicknesses.                   F065800100028 
           (DATA-ERR)The experimental error bars represent        F065800100029 
           statistical errors only.                               F065800100030 
           (ERR-DIG)Digitizing error                              F065800100031 
HISTORY    (20040309C)                                            F065800100032 
           (20090615A) Entry was deleted. See Entry O0950.        F065800100033 
ENDBIB              31          0                                 F065800100034 
COMMON               3          3                                 F065800100035 
ERR-S      ERR-SYS    ERR-DIG                                     F065800100036 
PER-CENT   PER-CENT   NO-DIM                                      F065800100037 
 5.0        10.0       0.01                                       F065800100038 
ENDCOMMON            3          0                                 F065800100039 
ENDSUBENT           38          0                                 F065800199999 
NOSUBENT      F0658002   20090615                             F036F065800200001 
NOSUBENT      F0658003   20090615                             F036F065800300001 
ENDENTRY             3          0                                 F065899999999