ENTRY C2816 20220919 C281600000001 SUBENT C2816001 20220919 20240316 C281600100001 BIB 9 13 C281600100002 TITLE Deviations from Rutherford-scattering cross sections C281600100003 AUTHOR (M.Bozoian,K.M.Hubbard,M.Nastasi) C281600100004 INSTITUTE (1USALAS) C281600100005 REFERENCE (J,NIM/B,51,311,1990) C281600100006 #doi:10.1016/0168-583X(90)90548-9 C281600100007 FACILITY (CYCTM,1USALAS) 3 MV tandem accelerator at the LANL C281600100008 Ion Beam Materials Lab. C281600100009 DETECTOR (SIBAR) Ions backscattered at an angle of 166 deg. C281600100010 were detected with a Si surface-barrier detector. C281600100011 SAMPLE A Ge/Au bilayer target of a total thickness of 2600 C281600100012 Angstrom, deposited onto Si. C281600100013 ERR-ANALYS (DATA-ERR) No information on source of uncertainties. C281600100014 HISTORY (20220903C) OG C281600100015 ENDBIB 13 0 C281600100016 NOCOMMON 0 0 C281600100017 ENDSUBENT 16 0 C281600199999 SUBENT C2816002 20220919 20240316 C281600200001 BIB 2 4 C281600200002 REACTION ((32-GE-0(A,EL)32-GE-0,,DA)/ C281600200003 (79-AU-197(A,EL)79-AU-197,,DA)) C281600200004 STATUS (CURVE,,M.Bozoian+,J,NIM/B,51,311,1990) Fig.1 C281600200005 digitized by GSYS-2.4.9. C281600200006 ENDBIB 4 0 C281600200007 COMMON 1 3 C281600200008 ANG C281600200009 ADEG C281600200010 166. C281600200011 ENDCOMMON 3 0 C281600200012 DATA 3 9 C281600200013 EN-CM DATA DATA-ERR C281600200014 MEV NO-DIM NO-DIM C281600200015 3.801 0.163 0.002 C281600200016 4.760 0.162 0.002 C281600200017 5.700 0.164 0.002 C281600200018 6.666 0.163 0.002 C281600200019 7.138 0.162 0.002 C281600200020 7.609 0.159 0.002 C281600200021 7.830 0.156 0.002 C281600200022 8.070 0.152 0.001 C281600200023 8.363 0.146 0.002 C281600200024 ENDDATA 11 0 C281600200025 ENDSUBENT 24 0 C281600299999 ENDENTRY 2 0 C281699999999