ENTRY 14542 20190611 14551454200000001 SUBENT 14542001 20190611 14551454200100001 BIB 9 29 1454200100002 TITLE Element yields in 252Cf spontaneous fission 1454200100003 determined from measured X-ray multiplicities 1454200100004 AUTHOR (R.J.Lipinski,B.W.Wehring) 1454200100005 INSTITUTE (1USAUI) 1454200100006 REFERENCE (J,PL/B,66,326,1977) 1454200100007 #doi:10.1016/0370-2693(77)90006-5 1454200100008 #NSR: 1977LI03 1454200100009 SAMPLE A 252Cf source (92 fissions/s) on a thin nickel foil 1454200100010 (226 mu-g/cm2) 1454200100011 DETECTOR (SCIN,SILI) A 252Cf source was sandwiched between two 1454200100012 thin plastic scintillators (0.025 cm thick), and this 1454200100013 was placed between two in-house fabricated Si(Li) X-ray1454200100014 detectors with solid angle fractions of 0.18 each, and 1454200100015 sensitive regions of 3x170 mm2 each. 1454200100016 METHOD (COINC,XSPEC) Coincident signals from the two 1454200100017 scintillators indicated fission. The fission signal and1454200100018 the two X-ray detector signals were required to be 1454200100019 within 2.5mu-s of each other to trigger a two-parameter1454200100020 accumulation system in which the outputs of each X-ray 1454200100021 detector were recorded event by event on magnetic tape.1454200100022 Multiple K X-ray detection events were identified by 1454200100023 coincident outputs from the two X-ray detectors and by 1454200100024 a single detector output which was equal to the sum of 1454200100025 several single K X-ray detection outputs. 1454200100026 ANALYSIS A statistical model for X-ray emission was used to 1454200100027 determine the element yield by letting the ratios in 1454200100028 the detection rates of the various multiplicities fix 1454200100029 the parameters in the model. 1454200100030 HISTORY (20190611C) OG. 1454200100031 ENDBIB 29 0 1454200100032 NOCOMMON 0 0 1454200100033 ENDSUBENT 32 0 1454200199999 SUBENT 14542002 20190611 14551454200200001 BIB 4 5 1454200200002 REACTION (98-CF-252(0,F)ELEM,CHG,FY) 1454200200003 ERR-ANALYS (ERR-S) The statistical errors propagated from the 1454200200004 measured detection rates and the detector efficiencies 1454200200005 MISC-COL (MISC) Average value in the element pair (Z,) 1454200200006 STATUS (TABLE) Table 1 in Phys.Lett.B,66,326,1977 1454200200007 ENDBIB 5 0 1454200200008 NOCOMMON 0 0 1454200200009 DATA 4 12 1454200200010 ELEMENT DATA ERR-S MISC 1454200200011 NO-DIM PC/FIS PC/FIS NO-DIM 1454200200012 51. 3.0 0.4 47. 1454200200013 52. 7.0 0.7 46. 1454200200014 53. 7.3 0.7 45. 1454200200015 54. 10.2 1.1 44. 1454200200016 55. 14.2 1.4 43. 1454200200017 56. 18.1 1.9 42. 1454200200018 57. 11.1 1.2 41. 1454200200019 58. 8.4 1.0 40. 1454200200020 59. 4.6 0.5 39. 1454200200021 60. 3.1 0.4 38. 1454200200022 61. 1.8 0.2 37. 1454200200023 62. 1.2 0.2 36. 1454200200024 ENDDATA 14 0 1454200200025 ENDSUBENT 24 0 1454200299999 ENDENTRY 2 0 1454299999999